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Kou L, Ma Z, Li YJ, et al. Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback. Nanotechnology. 2015;26(19):195701doi: 10.1088/0957-4484/26/19/195701.
Kou, L., Ma, Z., Li, Y. J., Naitoh, Y., Komiyama, M., & Sugawara, Y. (2015). Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback. Nanotechnology, 26(19), 195701. https://doi.org/10.1088/0957-4484/26/19/195701
Kou, Lili, et al. "Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback." Nanotechnology vol. 26,19 (2015): 195701. doi: https://doi.org/10.1088/0957-4484/26/19/195701
Kou L, Ma Z, Li YJ, Naitoh Y, Komiyama M, Sugawara Y. Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback. Nanotechnology. 2015 May 15;26(19):195701. doi: 10.1088/0957-4484/26/19/195701. Epub 2015 Apr 21. PMID: 25895740.
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