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Caleman C, Tîmneanu N, Martin AV, et al. Ultrafast self-gating Bragg diffraction of exploding nanocrystals in an X-ray laser. Opt Express. 2015;23(2):1213-31doi: 10.1364/OE.23.001213.
Caleman, C., Tîmneanu, N., Martin, A. V., Jönsson, H. O., Aquila, A., Barty, A., Scott, H. A., White, T. A., & Chapman, H. N. (2015). Ultrafast self-gating Bragg diffraction of exploding nanocrystals in an X-ray laser. Optics express, 23(2), 1213-31. https://doi.org/10.1364/OE.23.001213
Caleman, Carl, et al. "Ultrafast self-gating Bragg diffraction of exploding nanocrystals in an X-ray laser." Optics express vol. 23,2 (2015): 1213-31. doi: https://doi.org/10.1364/OE.23.001213
Caleman C, Tîmneanu N, Martin AV, Jönsson HO, Aquila A, Barty A, Scott HA, White TA, Chapman HN. Ultrafast self-gating Bragg diffraction of exploding nanocrystals in an X-ray laser. Opt Express. 2015 Jan 26;23(2):1213-31. doi: 10.1364/OE.23.001213. PMID: 25835880.
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Opt Express. 2015 Jan 26;23(2):1213-31. doi: 10.1364/OE.23.001213.

Ultrafast self-gating Bragg diffraction of exploding nanocrystals in an X-ray laser.

Optics express

Carl Caleman, Nicuşor Tîmneanu, Andrew V Martin, H Olof Jönsson, Andrew Aquila, Anton Barty, Howard A Scott, Thomas A White, Henry N Chapman

PMID: 25835880 DOI: 10.1364/OE.23.001213

Abstract

In structural determination of crystalline proteins using intense femtosecond X-ray lasers, damage processes lead to loss of structural coherence during the exposure. We use a nonthermal description for the damage dynamics to calculate the ultrafast ionization and the subsequent atomic displacement. These effects degrade the Bragg diffraction on femtosecond time scales and gate the ultrafast imaging. This process is intensity and resolution dependent. At high intensities the signal is gated by the ionization affecting low resolution information first. At lower intensities, atomic displacement dominates the loss of coherence affecting high-resolution information. We find that pulse length is not a limiting factor as long as there is a high enough X-ray flux to measure a diffracted signal.

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