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J Nanosci Nanotechnol. 2014 Aug;14(8):6112-5. doi: 10.1166/jnn.2014.8306.

Effect of sapphire nitridation and group-III source flow rate ratio on In-incorporation into InGaN grown by metalorganic vapor phase epitaxy.

Journal of nanoscience and nanotechnology

J H Choi, K Shojiki, T Tanikawa, T Hanada, R Katayama, T Matsuoka

PMID: 25936067 DOI: 10.1166/jnn.2014.8306

Abstract

In-composition of N-polar InGaN films on the sapphire substrate with the surface nitridation was investigated. By varying the ratio of the group-III source flow rate from 0.7 to 0.95, the In-composition and the surface morphologies of InGaN films were changed. The In-composition of N-polar InGaN films was affected by the strain relaxation and the surface morphologies.

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