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Tong V, Jiang J, Wilkinson AJ, et al. The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. Ultramicroscopy. 2015;155:62-73doi: 10.1016/j.ultramic.2015.04.019.
Tong, V., Jiang, J., Wilkinson, A. J., & Britton, T. B. (2015). The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. Ultramicroscopy, 15562-73. https://doi.org/10.1016/j.ultramic.2015.04.019
Tong, Vivian, et al. "The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements." Ultramicroscopy vol. 155 (2015): 62-73. doi: https://doi.org/10.1016/j.ultramic.2015.04.019
Tong V, Jiang J, Wilkinson AJ, Britton TB. The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. Ultramicroscopy. 2015 Aug;155:62-73. doi: 10.1016/j.ultramic.2015.04.019. Epub 2015 Apr 28. PMID: 25957534.
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Ultramicroscopy. 2015 Aug;155:62-73. doi: 10.1016/j.ultramic.2015.04.019. Epub 2015 Apr 28.

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.

Ultramicroscopy

Vivian Tong, Jun Jiang, Angus J Wilkinson, T Ben Britton

Affiliations

  1. Department of Materials, Imperial College London, Prince Consort Road, London SW7 2AZ, UK. Electronic address: [email protected].
  2. Department of Materials, Imperial College London, Prince Consort Road, London SW7 2AZ, UK.
  3. Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK.

PMID: 25957534 DOI: 10.1016/j.ultramic.2015.04.019

Abstract

High resolution, cross-correlation-based, electron backscatter diffraction (EBSD) measures the variation of elastic strains and lattice rotations from a reference state. Regions near grain boundaries are often of interest but overlap of patterns from the two grains could reduce accuracy of the cross-correlation analysis. To explore this concern, patterns from the interior of two grains have been mixed to simulate the interaction volume crossing a grain boundary so that the effect on the accuracy of the cross correlation results can be tested. It was found that the accuracy of HR-EBSD strain measurements performed in a FEG-SEM on zirconium remains good until the incident beam is less than 18 nm from a grain boundary. A simulated microstructure was used to measure how often pattern overlap occurs at any given EBSD step size, and a simple relation was found linking the probability of overlap with step size.

Copyright © 2015 The Authors. Published by Elsevier B.V. All rights reserved.

Keywords: Cross-correlation; Grain boundary; High-resolution EBSD; Pattern overlap

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