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Toci G, Pirri A, Beitlerova A, et al. Characterization of the lasing properties of a 5%Yb doped Lu₂SiO₅ crystal along its three principal dielectric axes. Opt Express. 2015;23(10):13210-21doi: 10.1364/OE.23.013210.
Toci, G., Pirri, A., Beitlerova, A., Shoji, Y., Yoshikawa, A., Hybler, J., Nikl, M., & Vannini, M. (2015). Characterization of the lasing properties of a 5%Yb doped Lu₂SiO₅ crystal along its three principal dielectric axes. Optics express, 23(10), 13210-21. https://doi.org/10.1364/OE.23.013210
Toci, Guido, et al. "Characterization of the lasing properties of a 5%Yb doped Lu₂SiO₅ crystal along its three principal dielectric axes." Optics express vol. 23,10 (2015): 13210-21. doi: https://doi.org/10.1364/OE.23.013210
Toci G, Pirri A, Beitlerova A, Shoji Y, Yoshikawa A, Hybler J, Nikl M, Vannini M. Characterization of the lasing properties of a 5%Yb doped Lu₂SiO₅ crystal along its three principal dielectric axes. Opt Express. 2015 May 18;23(10):13210-21. doi: 10.1364/OE.23.013210. PMID: 26074573.
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