Display options
Cite
Diepold M, Fernandes LM, Machado J, et al. Improved x-ray detection and particle identification with avalanche photodiodes. Rev Sci Instrum. 2015;86(5):053102doi: 10.1063/1.4921195.
Diepold, M., Fernandes, L. M., Machado, J., Amaro, P., Abdou-Ahmed, M., Amaro, F. D., Antognini, A., Biraben, F., Chen, T. L., Covita, D. S., Dax, A. J., Franke, B., Galtier, S., Gouvea, A. L., Götzfried, J., Graf, T., Hänsch, T. W., Hildebrandt, M., Indelicato, P., Julien, L., Kirch, K., Knecht, A., Kottmann, F., Krauth, J. J., Liu, Y. W., Monteiro, C. M., Mulhauser, F., Naar, B., Nebel, T., Nez, F., Santos, J. P., dos Santos, J. M., Schuhmann, K., Szabo, C. I., Taqqu, D., Veloso, J. F., Voss, A., Weichelt, B., & Pohl, R. (2015). Improved x-ray detection and particle identification with avalanche photodiodes. The Review of scientific instruments, 86(5), 053102. https://doi.org/10.1063/1.4921195
Diepold, Marc, et al. "Improved x-ray detection and particle identification with avalanche photodiodes." The Review of scientific instruments vol. 86,5 (2015): 053102. doi: https://doi.org/10.1063/1.4921195
Diepold M, Fernandes LM, Machado J, Amaro P, Abdou-Ahmed M, Amaro FD, Antognini A, Biraben F, Chen TL, Covita DS, Dax AJ, Franke B, Galtier S, Gouvea AL, Götzfried J, Graf T, Hänsch TW, Hildebrandt M, Indelicato P, Julien L, Kirch K, Knecht A, Kottmann F, Krauth JJ, Liu YW, Monteiro CM, Mulhauser F, Naar B, Nebel T, Nez F, Santos JP, dos Santos JM, Schuhmann K, Szabo CI, Taqqu D, Veloso JF, Voss A, Weichelt B, Pohl R. Improved x-ray detection and particle identification with avalanche photodiodes. Rev Sci Instrum. 2015 May;86(5):053102. doi: 10.1063/1.4921195. PMID: 26026509.
Copy Download .nbib Format: NLM
Share it on

Rev Sci Instrum. 2015 May;86(5):053102. doi: 10.1063/1.4921195.

Improved x-ray detection and particle identification with avalanche photodiodes.

The Review of scientific instruments

Marc Diepold, Luis M P Fernandes, Jorge Machado, Pedro Amaro, Marwan Abdou-Ahmed, Fernando D Amaro, Aldo Antognini, François Biraben, Tzu-Ling Chen, Daniel S Covita, Andreas J Dax, Beatrice Franke, Sandrine Galtier, Andrea L Gouvea, Johannes Götzfried, Thomas Graf, Theodor W Hänsch, Malte Hildebrandt, Paul Indelicato, Lucile Julien, Klaus Kirch, Andreas Knecht, Franz Kottmann, Julian J Krauth, Yi-Wei Liu, Cristina M B Monteiro, Françoise Mulhauser, Boris Naar, Tobias Nebel, François Nez, José Paulo Santos, Joaquim M F dos Santos, Karsten Schuhmann, Csilla I Szabo, David Taqqu, João F C A Veloso, Andreas Voss, Birgit Weichelt, Randolf Pohl

Affiliations

  1. Max Planck Institute of Quantum Optics, 85748 Garching, Germany.
  2. LIBPhys, Physics Department, Universidade de Coimbra, 3004-516 Coimbra, Portugal.
  3. Laboratório de Instrumentação, Engenharia Biomédica e Física da Radiação (LIBPhys-UNL) e Departamento de Física da Faculdade de Ciências e Tecnologia da Universidade Nova de Lisboa, Monte da Caparica, 2892-516 Caparica, Portugal.
  4. Institut für Strahlwerkzeuge, Universität Stuttgart, 70569 Stuttgart, Germany.
  5. Institute for Particle Physics, ETH Zurich, 8093 Zurich, Switzerland.
  6. Laboratoire Kastler Brossel, UPMC-Sorbonne Universités, CNRS, ENS-PSL Research University, Collège de France, 4 place Jussieu, case 74, 75005 Paris, France.
  7. Physics Department, National Tsing Hua University, Hsinchu 300, Taiwan.
  8. i3N, Universidade de Aveiro, Campus de Santiago, 3810-193 Aveiro, Portugal.
  9. Paul Scherrer Institute, 5232 Villigen-PSI, Switzerland.

PMID: 26026509 DOI: 10.1063/1.4921195

Abstract

Avalanche photodiodes are commonly used as detectors for low energy x-rays. In this work, we report on a fitting technique used to account for different detector responses resulting from photoabsorption in the various avalanche photodiode layers. The use of this technique results in an improvement of the energy resolution at 8.2 keV by up to a factor of 2 and corrects the timing information by up to 25 ns to account for space dependent electron drift time. In addition, this waveform analysis is used for particle identification, e.g., to distinguish between x-rays and MeV electrons in our experiment.

Publication Types