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Adhika DR, Tanaka M, Daio T, et al. Crack tip shielding observed with high-resolution transmission electron microscopy. Microscopy (Oxf). 2015;64(5):335-40doi: 10.1093/jmicro/dfv032.
Adhika, D. R., Tanaka, M., Daio, T., & Higashida, K. (2015). Crack tip shielding observed with high-resolution transmission electron microscopy. Microscopy (Oxford, England), 64(5), 335-40. https://doi.org/10.1093/jmicro/dfv032
Adhika, Damar Rastri, et al. "Crack tip shielding observed with high-resolution transmission electron microscopy." Microscopy (Oxford, England) vol. 64,5 (2015): 335-40. doi: https://doi.org/10.1093/jmicro/dfv032
Adhika DR, Tanaka M, Daio T, Higashida K. Crack tip shielding observed with high-resolution transmission electron microscopy. Microscopy (Oxf). 2015 Oct;64(5):335-40. doi: 10.1093/jmicro/dfv032. Epub 2015 Jun 26. PMID: 26115957; PMCID: PMC4711291.
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Microscopy (Oxf). 2015 Oct;64(5):335-40. doi: 10.1093/jmicro/dfv032. Epub 2015 Jun 26.

Crack tip shielding observed with high-resolution transmission electron microscopy.

Microscopy (Oxford, England)

Damar Rastri Adhika, Masaki Tanaka, Takeshi Daio, Kenji Higashida

Affiliations

  1. Department of Materials Science and Engineering, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan.
  2. Department of Materials Science and Engineering, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan [email protected].
  3. Department of Hydrogen Energy Systems, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan.

PMID: 26115957 PMCID: PMC4711291 DOI: 10.1093/jmicro/dfv032

Abstract

The dislocation shielding field at a crack tip was experimentally proven at the atomic scale by measuring the local strain in front of the crack tip using high-resolution transmission electron microscopy (HRTEM) and geometric phase analysis (GPA). Single crystalline (110) silicon wafers were employed. Cracks were introduced using a Vickers indenter at room temperature. The crack tip region was observed using HRTEM followed by strain measurements using GPA. The measured strain field at the crack tip was compressive owing to dislocation shielding, which is in good agreement with the strain field calculated from elastic theory.

© The Author 2015. Published by Oxford University Press on behalf of The Japanese Society of Microscopy.

Keywords: HRTEM; brittle-to-ductile transition; dislocation shielding effect; fracture toughness; geometric phase analysis

References

  1. J Electron Microsc Tech. 1988 Feb;8(2):193-200 - PubMed

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