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Li P, Batey DJ, Edo TB, et al. Separation of three-dimensional scattering effects in tilt-series Fourier ptychography. Ultramicroscopy. 2015;158:1-7doi: 10.1016/j.ultramic.2015.06.010.
Li, P., Batey, D. J., Edo, T. B., & Rodenburg, J. M. (2015). Separation of three-dimensional scattering effects in tilt-series Fourier ptychography. Ultramicroscopy, 1581-7. https://doi.org/10.1016/j.ultramic.2015.06.010
Li, Peng, et al. "Separation of three-dimensional scattering effects in tilt-series Fourier ptychography." Ultramicroscopy vol. 158 (2015): 1-7. doi: https://doi.org/10.1016/j.ultramic.2015.06.010
Li P, Batey DJ, Edo TB, Rodenburg JM. Separation of three-dimensional scattering effects in tilt-series Fourier ptychography. Ultramicroscopy. 2015 Nov;158:1-7. doi: 10.1016/j.ultramic.2015.06.010. Epub 2015 Jun 14. PMID: 26093970.
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Ultramicroscopy. 2015 Nov;158:1-7. doi: 10.1016/j.ultramic.2015.06.010. Epub 2015 Jun 14.

Separation of three-dimensional scattering effects in tilt-series Fourier ptychography.

Ultramicroscopy

Peng Li, Darren J Batey, Tega B Edo, John M Rodenburg

Affiliations

  1. Department of Electrical and Electronic Engineering, University of Sheffield, S1 3JD, UK. Electronic address: [email protected].
  2. Department of Electrical and Electronic Engineering, University of Sheffield, S1 3JD, UK.
  3. Department of Physics and Astronomy, University of Sheffield, S3 7RH, UK.

PMID: 26093970 DOI: 10.1016/j.ultramic.2015.06.010

Abstract

We investigate a strategy for separating the influence of three-dimensional scattering effects in tilt-series reconstruction, a method for computationally increasing the resolution of a transmission microscope with an objective lens of small numerical aperture, as occurs in the transmission electron microscope (TEM). Recent work with visible light refers to the method as Fourier ptychography. To date, reconstruction methods presume that the object is thin enough so that the beam tilt induces only a shift of the diffraction pattern in the back focal plane. In fact, it is well known that the diffraction pattern changes as a function of beam tilt when the object is thick. In this paper, we use a simple visible light model to demonstrate a proof-of-principle of a new reconstruction algorithm that can cope with this difficulty and compare it with the aperture-scanning method. Although the experiment uses a model specimen with just two distinct layers separated along the optic axis, it should in principle be extendable to continuous objects.

Copyright © 2015 Elsevier B.V. All rights reserved.

Keywords: Fourier ptychography; Phase retrieval; Three-dimensional scattering

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