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Duncan DA, Kephart JM, Horsley K, et al. Characterization of Sulfur Bonding in CdS:O Buffer Layers for CdTe-based Thin-Film Solar Cells. ACS Appl Mater Interfaces. 2015;7(30):16382-6doi: 10.1021/acsami.5b03503.
Duncan, D. A., Kephart, J. M., Horsley, K., Blum, M., Mezher, M., Weinhardt, L., Häming, M., Wilks, R. G., Hofmann, T., Yang, W., Bär, M., Sampath, W. S., & Heske, C. (2015). Characterization of Sulfur Bonding in CdS:O Buffer Layers for CdTe-based Thin-Film Solar Cells. ACS applied materials & interfaces, 7(30), 16382-6. https://doi.org/10.1021/acsami.5b03503
Duncan, Douglas A, et al. "Characterization of Sulfur Bonding in CdS:O Buffer Layers for CdTe-based Thin-Film Solar Cells." ACS applied materials & interfaces vol. 7,30 (2015): 16382-6. doi: https://doi.org/10.1021/acsami.5b03503
Duncan DA, Kephart JM, Horsley K, Blum M, Mezher M, Weinhardt L, Häming M, Wilks RG, Hofmann T, Yang W, Bär M, Sampath WS, Heske C. Characterization of Sulfur Bonding in CdS:O Buffer Layers for CdTe-based Thin-Film Solar Cells. ACS Appl Mater Interfaces. 2015 Aug 05;7(30):16382-6. doi: 10.1021/acsami.5b03503. Epub 2015 Jul 22. PMID: 26200260.
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ACS Appl Mater Interfaces. 2015 Aug 05;7(30):16382-6. doi: 10.1021/acsami.5b03503. Epub 2015 Jul 22.

Characterization of Sulfur Bonding in CdS:O Buffer Layers for CdTe-based Thin-Film Solar Cells.

ACS applied materials & interfaces

Douglas A Duncan, Jason M Kephart, Kimberly Horsley, Monika Blum, Michelle Mezher, Lothar Weinhardt, Marc Häming, Regan G Wilks, Timo Hofmann, Wanli Yang, Marcus Bär, Walajabad S Sampath, Clemens Heske

Affiliations

  1. †Department of Chemistry and Biochemistry, University of Nevada, Las Vegas (UNLV), Las Vegas, Nevada 89154-4003, United States.
  2. ‡Renewable Energy, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, 14109 Berlin, Germany.
  3. §Department of Mechanical Engineering, Colorado State University, Fort Collins, Colorado 80523, United States.
  4. ?Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.
  5. ?ANKA Synchrotron Radiation Facility, Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany.
  6. #Institute for Photon Science and Synchrotron Radiation, Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany.
  7. ?Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute of Technology (KIT), 76128 Karlsruhe, Germany.
  8. ?Institut für Physik und Chemie, Brandenburgische Technische Universität Cottbus-Senftenberg, 03046 Cottbus, Germany.

PMID: 26200260 DOI: 10.1021/acsami.5b03503

Abstract

On the basis of a combination of X-ray photoelectron spectroscopy and synchrotron-based X-ray emission spectroscopy, we present a detailed characterization of the chemical structure of CdS:O thin films that can be employed as a substitute for CdS layers in thin-film solar cells. It is possible to analyze the local chemical environment of the probed elements, in particular sulfur, hence allowing insights into the species-specific composition of the films and their surfaces. A detailed quantification of the observed sulfur environments (i.e., sulfide, sulfate, and an intermediate oxide) as a function of oxygen content is presented, allowing a deliberate optimization of CdS:O thin films for their use as alternative buffer layers in thin-film photovoltaic devices.

Keywords: CdS; CdTe; XPS; alternative buffer layers; solar cells

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