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Wagner C, Green MF, Leinen P, et al. Scanning Quantum Dot Microscopy. Phys Rev Lett. 2015;115(2):026101doi: 10.1103/PhysRevLett.115.026101.
Wagner, C., Green, M. F., Leinen, P., Deilmann, T., Krüger, P., Rohlfing, M., Temirov, R., & Tautz, F. S. (2015). Scanning Quantum Dot Microscopy. Physical review letters, 115(2), 026101. https://doi.org/10.1103/PhysRevLett.115.026101
Wagner, Christian, et al. "Scanning Quantum Dot Microscopy." Physical review letters vol. 115,2 (2015): 026101. doi: https://doi.org/10.1103/PhysRevLett.115.026101
Wagner C, Green MF, Leinen P, Deilmann T, Krüger P, Rohlfing M, Temirov R, Tautz FS. Scanning Quantum Dot Microscopy. Phys Rev Lett. 2015 Jul 10;115(2):026101. doi: 10.1103/PhysRevLett.115.026101. Epub 2015 Jul 06. PMID: 26207484.
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Phys Rev Lett. 2015 Jul 10;115(2):026101. doi: 10.1103/PhysRevLett.115.026101. Epub 2015 Jul 06.

Scanning Quantum Dot Microscopy.

Physical review letters

Christian Wagner, Matthew F B Green, Philipp Leinen, Thorsten Deilmann, Peter Krüger, Michael Rohlfing, Ruslan Temirov, F Stefan Tautz

Affiliations

  1. Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany.
  2. Jülich Aachen Research Alliance (JARA)-Fundamentals of Future Information Technology, 52425 Jülich, Germany.
  3. Institut für Festkörpertheorie, Westfälische Wilhelms-Universität Münster, 48149 Münster, Germany.

PMID: 26207484 DOI: 10.1103/PhysRevLett.115.026101

Abstract

We introduce a scanning probe technique that enables three-dimensional imaging of local electrostatic potential fields with subnanometer resolution. Registering single electron charging events of a molecular quantum dot attached to the tip of an atomic force microscope operated at 5 K, equipped with a qPlus tuning fork, we image the quadrupole field of a single molecule. To demonstrate quantitative measurements, we investigate the dipole field of a single metal adatom adsorbed on a metal surface. We show that because of its high sensitivity the technique can probe electrostatic potentials at large distances from their sources, which should allow for the imaging of samples with increased surface roughness.

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