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Walder R, Paik DH, Bull MS, et al. Ultrastable measurement platform: sub-nm drift over hours in 3D at room temperature. Opt Express. 2015;23(13):16554-64doi: 10.1364/OE.23.016554.
Walder, R., Paik, D. H., Bull, M. S., Sauer, C., & Perkins, T. T. (2015). Ultrastable measurement platform: sub-nm drift over hours in 3D at room temperature. Optics express, 23(13), 16554-64. https://doi.org/10.1364/OE.23.016554
Walder, Robert, et al. "Ultrastable measurement platform: sub-nm drift over hours in 3D at room temperature." Optics express vol. 23,13 (2015): 16554-64. doi: https://doi.org/10.1364/OE.23.016554
Walder R, Paik DH, Bull MS, Sauer C, Perkins TT. Ultrastable measurement platform: sub-nm drift over hours in 3D at room temperature. Opt Express. 2015 Jun 29;23(13):16554-64. doi: 10.1364/OE.23.016554. PMID: 26191667.
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Opt Express. 2015 Jun 29;23(13):16554-64. doi: 10.1364/OE.23.016554.

Ultrastable measurement platform: sub-nm drift over hours in 3D at room temperature.

Optics express

Robert Walder, D Hern Paik, Matthew S Bull, Carl Sauer, Thomas T Perkins

PMID: 26191667 DOI: 10.1364/OE.23.016554

Abstract

Advanced optical traps can probe single molecules with Ångstrom-scale precision, but drift limits the utility of these instruments. To achieve Å-scale stability, a differential measurement scheme between a pair of laser foci was introduced that substantially exceeds the inherent mechanical stability of various types of microscopes at room temperature. By using lock-in detection to measure both lasers with a single quadrant photodiode, we enhanced the differential stability of this optical reference frame and thereby stabilized an optical-trapping microscope to 0.2 Å laterally over 100 s based on the Allan deviation. In three dimensions, we achieved stabilities of 1 Å over 1,000 s and 1 nm over 15 h. This stability was complemented by high measurement bandwidth (100 kHz). Overall, our compact back-scattered detection enables an ultrastable measurement platform compatible with optical traps, atomic force microscopy, and optical microscopy, including super-resolution techniques.

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