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Beltrán MD, Molina RL, Aznar MÁ, et al. Double Laser for Depth Measurement of Thin Films of Ice. Sensors (Basel). 2015;15(10):25123-38doi: 10.3390/s151025123.
Beltrán, M. D., Molina, R. L., Aznar, M. �. �., Moltó, C. S., & Verdú, C. M. (2015). Double Laser for Depth Measurement of Thin Films of Ice. Sensors (Basel, Switzerland), 15(10), 25123-38. https://doi.org/10.3390/s151025123
Beltrán, Manuel Domingo, et al. "Double Laser for Depth Measurement of Thin Films of Ice." Sensors (Basel, Switzerland) vol. 15,10 (2015): 25123-38. doi: https://doi.org/10.3390/s151025123
Beltrán MD, Molina RL, Aznar MÁ, Moltó CS, Verdú CM. Double Laser for Depth Measurement of Thin Films of Ice. Sensors (Basel). 2015 Sep 29;15(10):25123-38. doi: 10.3390/s151025123. PMID: 26426024; PMCID: PMC4634385.
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Sensors (Basel). 2015 Sep 29;15(10):25123-38. doi: 10.3390/s151025123.

Double Laser for Depth Measurement of Thin Films of Ice.

Sensors (Basel, Switzerland)

Manuel Domingo Beltrán, Ramón Luna Molina, Miguel Ángel Satorre Aznar, Carmina Santonja Moltó, Carlos Millán Verdú

Affiliations

  1. Centro de Tecnologías Físicas, Universitat Politècnica de València, 46022 Valencia, Spain. [email protected].
  2. Centro de Tecnologías Físicas, Universitat Politècnica de València, 46022 Valencia, Spain. [email protected].
  3. Centro de Tecnologías Físicas, Universitat Politècnica de València, 46022 Valencia, Spain. [email protected].
  4. Centro de Tecnologías Físicas, Universitat Politècnica de València, 46022 Valencia, Spain. [email protected].
  5. Centro de Tecnologías Físicas, Universitat Politècnica de València, 46022 Valencia, Spain. [email protected].

PMID: 26426024 PMCID: PMC4634385 DOI: 10.3390/s151025123

Abstract

The use of thin films is extensive in both science and industry. We have created an experimental system that allows us to measure the thicknesses of thin films (with typical thicknesses of around 1 µm) in real time without the need for any prior knowledge or parameters. Using the proposed system, we can also measure the refractive index of the thin film material exactly under the same experimental conditions. We have also obtained interesting results with regard to structural changes in the solid substance with changing temperature and have observed the corresponding behavior of mixtures of substances.

Keywords: refractive index; thickness; thin films

References

  1. Astrophys J. 1990 May 20;355(1):357-72 - PubMed

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