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Chang IY, Joester D. Large Area Cryo-Planing of Vitrified Samples Using Broad-Beam Ion Milling. Microsc Microanal. 2015;21(6):1616-1621doi: 10.1017/S143192761501510X.
Chang, I. Y., & Joester, D. (2015). Large Area Cryo-Planing of Vitrified Samples Using Broad-Beam Ion Milling. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 21(6), 1616-1621. https://doi.org/10.1017/S143192761501510X
Chang, Irene Y T, and Joester, Derk. "Large Area Cryo-Planing of Vitrified Samples Using Broad-Beam Ion Milling." Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 21,6 (2015): 1616-1621. doi: https://doi.org/10.1017/S143192761501510X
Chang IY, Joester D. Large Area Cryo-Planing of Vitrified Samples Using Broad-Beam Ion Milling. Microsc Microanal. 2015 Dec;21(6):1616-1621. doi: 10.1017/S143192761501510X. Epub 2015 Oct 12. PMID: 26455924.
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