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Beadie G, Brindza M, Flynn RA, et al. Refractive index measurements of poly(methyl methacrylate) (PMMA) from 0.4-1.6 μm. Appl Opt. 2015;54(31):F139-43doi: 10.1364/AO.54.00F139.
Beadie, G., Brindza, M., Flynn, R. A., Rosenberg, A., & Shirk, J. S. (2015). Refractive index measurements of poly(methyl methacrylate) (PMMA) from 0.4-1.6 μm. Applied optics, 54(31), F139-43. https://doi.org/10.1364/AO.54.00F139
Beadie, G, et al. "Refractive index measurements of poly(methyl methacrylate) (PMMA) from 0.4-1.6 μm." Applied optics vol. 54,31 (2015): F139-43. doi: https://doi.org/10.1364/AO.54.00F139
Beadie G, Brindza M, Flynn RA, Rosenberg A, Shirk JS. Refractive index measurements of poly(methyl methacrylate) (PMMA) from 0.4-1.6 μm. Appl Opt. 2015 Nov 01;54(31):F139-43. doi: 10.1364/AO.54.00F139. PMID: 26560600.
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Appl Opt. 2015 Nov 01;54(31):F139-43. doi: 10.1364/AO.54.00F139.

Refractive index measurements of poly(methyl methacrylate) (PMMA) from 0.4-1.6 μm.

Applied optics

G Beadie, Michael Brindza, Richard A Flynn, A Rosenberg, James S Shirk

PMID: 26560600 DOI: 10.1364/AO.54.00F139

Abstract

Using a transmission-spectrum-based method, the refractive index of a 50 μm thick sample of poly(methyl methacrylate) (PMMA) was measured as a function of wavelength. To mitigate the effects of nonplane-parallel surfaces, the sample was measured at 16 different locations. The technique resulted in the measurement of index at several thousand independent wavelengths from 0.42 to 1.62 μm, with a relative RMS accuracy <0.5×10(-4) and absolute accuracy <2×10(-4).

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