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Morawski I, Spiegelberg R, Korte S, et al. Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications. Rev Sci Instrum. 2015;86(12):123703doi: 10.1063/1.4936975.
Morawski, I., Spiegelberg, R., Korte, S., & Voigtländer, B. (2015). Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications. The Review of scientific instruments, 86(12), 123703. https://doi.org/10.1063/1.4936975
Morawski, Ireneusz, et al. "Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications." The Review of scientific instruments vol. 86,12 (2015): 123703. doi: https://doi.org/10.1063/1.4936975
Morawski I, Spiegelberg R, Korte S, Voigtländer B. Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications. Rev Sci Instrum. 2015 Dec;86(12):123703. doi: 10.1063/1.4936975. PMID: 26724038.
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