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Barr M, Fahy A, Martens J, et al. Unlocking new contrast in a scanning helium microscope. Nat Commun. 2016;7:10189doi: 10.1038/ncomms10189.
Barr, M., Fahy, A., Martens, J., Jardine, A. P., Ward, D. J., Ellis, J., Allison, W., & Dastoor, P. C. (2016). Unlocking new contrast in a scanning helium microscope. Nature communications, 710189. https://doi.org/10.1038/ncomms10189
Barr, M, et al. "Unlocking new contrast in a scanning helium microscope." Nature communications vol. 7 (2016): 10189. doi: https://doi.org/10.1038/ncomms10189
Barr M, Fahy A, Martens J, Jardine AP, Ward DJ, Ellis J, Allison W, Dastoor PC. Unlocking new contrast in a scanning helium microscope. Nat Commun. 2016 Jan 04;7:10189. doi: 10.1038/ncomms10189. PMID: 26727303; PMCID: PMC4725762.
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Nat Commun. 2016 Jan 04;7:10189. doi: 10.1038/ncomms10189.

Unlocking new contrast in a scanning helium microscope.

Nature communications

M Barr, A Fahy, J Martens, A P Jardine, D J Ward, J Ellis, W Allison, P C Dastoor

Affiliations

  1. Centre for Organic Electronics, University of Newcastle, Callaghan, New South Wales 2308, Australia.
  2. Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, UK.

PMID: 26727303 PMCID: PMC4725762 DOI: 10.1038/ncomms10189

Abstract

Delicate structures (such as biological samples, organic films for polymer electronics and adsorbate layers) suffer degradation under the energetic probes of traditional microscopies. Furthermore, the charged nature of these probes presents difficulties when imaging with electric or magnetic fields, or for insulating materials where the addition of a conductive coating is not desirable. Scanning helium microscopy is able to image such structures completely non-destructively by taking advantage of a neutral helium beam as a chemically, electrically and magnetically inert probe of the sample surface. Here we present scanning helium micrographs demonstrating image contrast arising from a range of mechanisms including, for the first time, chemical contrast observed from a series of metal-semiconductor interfaces. The ability of scanning helium microscopy to distinguish between materials without the risk of damage makes it ideal for investigating a wide range of systems.

References

  1. Nature. 2014 Oct 9;514(7521):209-12 - PubMed
  2. Rev Sci Instrum. 2015 Feb;86(2):023704 - PubMed
  3. Phys Chem Chem Phys. 2014 Apr 28;16(16):7159-72 - PubMed
  4. Rev Sci Instrum. 2008 Dec;79(12):123301 - PubMed
  5. J Microsc. 2008 Jan;229(Pt 1):1-5 - PubMed
  6. J Phys Condens Matter. 2010 Mar 5;22(8):084020 - PubMed
  7. Nat Methods. 2015 Aug;12 (8):736-738 - PubMed
  8. J Microsc. 2012 Dec;248(3):223-7 - PubMed

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