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Miyamoto K, Nishioka S, Goto I, et al. Analysis of the beam halo in negative ion sources by using 3D3V PIC code. Rev Sci Instrum. 2016;87(2):02B124doi: 10.1063/1.4932390.
Miyamoto, K., Nishioka, S., Goto, I., Hatayama, A., Hanada, M., Kojima, A., & Hiratsuka, J. (2016). Analysis of the beam halo in negative ion sources by using 3D3V PIC code. The Review of scientific instruments, 87(2), 02B124. https://doi.org/10.1063/1.4932390
Miyamoto, K, et al. "Analysis of the beam halo in negative ion sources by using 3D3V PIC code." The Review of scientific instruments vol. 87,2 (2016): 02B124. doi: https://doi.org/10.1063/1.4932390
Miyamoto K, Nishioka S, Goto I, Hatayama A, Hanada M, Kojima A, Hiratsuka J. Analysis of the beam halo in negative ion sources by using 3D3V PIC code. Rev Sci Instrum. 2016 Feb;87(2):02B124. doi: 10.1063/1.4932390. PMID: 26932006.
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