Beilstein J Nanotechnol. 2016 Feb 24;7:284-95. doi: 10.3762/bjnano.7.26. eCollection 2016.
Beilstein journal of nanotechnology
Michael G Ruppert, S O Reza Moheimani
PMID: 26977385 PMCID: PMC4778537 DOI: 10.3762/bjnano.7.26
Using standard microelectromechanical system (MEMS) processes to coat a microcantilever with a piezoelectric layer results in a versatile transducer with inherent self-sensing capabilities. For applications in multifrequency atomic force microscopy (MF-AFM), we illustrate that a single piezoelectric layer can be simultaneously used for multimode excitation and detection of the cantilever deflection. This is achieved by a charge sensor with a bandwidth of 10 MHz and dual feedthrough cancellation to recover the resonant modes that are heavily buried in feedthrough originating from the piezoelectric capacitance. The setup enables the omission of the commonly used piezoelectric stack actuator and optical beam deflection sensor, alleviating limitations due to distorted frequency responses and instrumentation cost, respectively. The proposed method benefits from a more than two orders of magnitude increase in deflection to strain sensitivity on the fifth eigenmode leading to a remarkable signal-to-noise ratio. Experimental results using bimodal AFM imaging on a two component polymer sample validate that the self-sensing scheme can therefore be used to provide both the feedback signal, for topography imaging on the fundamental mode, and phase imaging on the higher eigenmode.
Keywords: atomic force microscopy; charge sensing; feedthrough cancellation; multimode sensor; piezoelectric cantilever; self-sensing
