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Evans-Nguyen KM, Gerling J, Brown H, et al. Towards universal ambient ionization: direct elemental analysis of solid substrates using microwave plasma ionization. Analyst. 2016;141(12):3811-20doi: 10.1039/c6an00176a.
Evans-Nguyen, K. M., Gerling, J., Brown, H., Miranda, M., Windom, A., & Speer, J. (2016). Towards universal ambient ionization: direct elemental analysis of solid substrates using microwave plasma ionization. The Analyst, 141(12), 3811-20. https://doi.org/10.1039/c6an00176a
Evans-Nguyen, K M, et al. "Towards universal ambient ionization: direct elemental analysis of solid substrates using microwave plasma ionization." The Analyst vol. 141,12 (2016): 3811-20. doi: https://doi.org/10.1039/c6an00176a
Evans-Nguyen KM, Gerling J, Brown H, Miranda M, Windom A, Speer J. Towards universal ambient ionization: direct elemental analysis of solid substrates using microwave plasma ionization. Analyst. 2016 Jun 21;141(12):3811-20. doi: 10.1039/c6an00176a. Epub 2016 Mar 16. PMID: 26979768.
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