Display options
Share it on

Analyst. 2016 Jun 21;141(12):3811-20. doi: 10.1039/c6an00176a. Epub 2016 Mar 16.

Towards universal ambient ionization: direct elemental analysis of solid substrates using microwave plasma ionization.

The Analyst

K M Evans-Nguyen, J Gerling, H Brown, M Miranda, A Windom, J Speer

Affiliations

  1. The Department of Chemistry, Biochemistry, and Physics, The University of Tampa, Tampa, FL, USA. [email protected].

PMID: 26979768 DOI: 10.1039/c6an00176a

Abstract

A microwave plasma was used for direct ambient ionization mass spectrometry of solid substrates, rapidly yielding atomic spectra without sample digestion or pre-treatment. Further, molecular spectra for the organic components of the substrate were obtained simultaneously, in an ambient ionization format. Initial characterization of the microwave plasma coupling to an ion trap mass spectrometer was carried out using solution standards and a microwave plasma torch (MPT) configuration. The configuration of the microwave plasma was then optimized for ambient ionization. The atomic and organic composition for samples applicable to nuclear and conventional forensic screening, including explosive/radionuclide mixtures and inorganic/organic gunshot residue component mixtures were successfully determined. The technologies employed are readily fieldable; the feasibility of a multimode ion source that could be coupled with a portable ion trap mass spectrometer for rapid, on-site, elemental, isotopic, and molecular screening of samples is demonstrated.

Publication Types