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Malmivirta M, Palonen H, Inkinen S, et al. Dirty limit scattering behind the decreased anisotropy of doped YBa2Cu3O7-δ thin films. J Phys Condens Matter. 2016;28(17):175702doi: 10.1088/0953-8984/28/17/175702.
Malmivirta, M., Palonen, H., Inkinen, S., Yao, L. D., Tikkanen, J., Huhtinen, H., Jha, R., Awana, V. P., van Dijken, S., & Paturi, P. (2016). Dirty limit scattering behind the decreased anisotropy of doped YBa2Cu3O7-δ thin films. Journal of physics. Condensed matter : an Institute of Physics journal, 28(17), 175702. https://doi.org/10.1088/0953-8984/28/17/175702
Malmivirta, M, et al. "Dirty limit scattering behind the decreased anisotropy of doped YBa2Cu3O7-δ thin films." Journal of physics. Condensed matter : an Institute of Physics journal vol. 28,17 (2016): 175702. doi: https://doi.org/10.1088/0953-8984/28/17/175702
Malmivirta M, Palonen H, Inkinen S, Yao LD, Tikkanen J, Huhtinen H, Jha R, Awana VP, van Dijken S, Paturi P. Dirty limit scattering behind the decreased anisotropy of doped YBa2Cu3O7-δ thin films. J Phys Condens Matter. 2016 May 05;28(17):175702. doi: 10.1088/0953-8984/28/17/175702. Epub 2016 Apr 05. PMID: 27046012.
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J Phys Condens Matter. 2016 May 05;28(17):175702. doi: 10.1088/0953-8984/28/17/175702. Epub 2016 Apr 05.

Dirty limit scattering behind the decreased anisotropy of doped YBa2Cu3O7-δ thin films.

Journal of physics. Condensed matter : an Institute of Physics journal

M Malmivirta, H Palonen, S Inkinen, L D Yao, J Tikkanen, H Huhtinen, R Jha, V P S Awana, S van Dijken, P Paturi

Affiliations

  1. Department of Physics and Astronomy, Wihuri Physical Laboratory, University of Turku, FI-20014 Turku, Finland. University of Turku Graduate School (UTUGS), University of Turku, FI-20014 Turku, Finland.

PMID: 27046012 DOI: 10.1088/0953-8984/28/17/175702

Abstract

We measured the resistivity of pulsed-laser-deposited BaCeO3 (BCO)-doped YBCO thin films containing spherical BCO particles in fields up to 30 T. The average diameter of the particles depends on the dopant concentration being below 4 nm in all the samples. Raised values of the upper critical field, Bc2, were observed in all the samples. Additionally, the parameter γ, describing the electron mass anisotropy, decreased from 6.2 in the undoped sample to 3.1 in the 8 wt.% BCO-doped sample. These results can be explained by the increased number of defects decreasing the mean free path of electrons and thus lowering the coherence length, which in turn increases Bc2.

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