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Rev Sci Instrum. 2016 Apr;87(4):043502. doi: 10.1063/1.4944864.

Development of Compton X-ray spectrometer for high energy resolution single-shot high-flux hard X-ray spectroscopy.

The Review of scientific instruments

Sadaoki Kojima, Takahito Ikenouchi, Yasunobu Arikawa, Shohei Sakata, Zhe Zhang, Yuki Abe, Mitsuo Nakai, Hiroaki Nishimura, Hiroyuki Shiraga, Tetsuo Ozaki, Shuji Miyamoto, Masashi Yamaguchi, Akinori Takemoto, Shinsuke Fujioka, Hiroshi Azechi

Affiliations

  1. Institute of Laser Engineering, Osaka University, 2-6 Yamada-oka, Suita, Osaka 565-0871, Japan.
  2. National Institute for Fusion Science, 322-6 Oroshi, Toki, Gifu 509-5292, Japan.
  3. Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Kouto, Kamigori-cho, Ako-gun, Hyogo 678-1205, Japan.

PMID: 27131669 DOI: 10.1063/1.4944864

Abstract

Hard X-ray spectroscopy is an essential diagnostics used to understand physical processes that take place in high energy density plasmas produced by intense laser-plasma interactions. A bundle of hard X-ray detectors, of which the responses have different energy thresholds, is used as a conventional single-shot spectrometer for high-flux (>10(13) photons/shot) hard X-rays. However, high energy resolution (Δhv/hv < 0.1) is not achievable with a differential energy threshold (DET) X-ray spectrometer because its energy resolution is limited by energy differences between the response thresholds. Experimental demonstration of a Compton X-ray spectrometer has already been performed for obtaining higher energy resolution than that of DET spectrometers. In this paper, we describe design details of the Compton X-ray spectrometer, especially dependence of energy resolution and absolute response on photon-electron converter design and its background reduction scheme, and also its application to the laser-plasma interaction experiment. The developed spectrometer was used for spectroscopy of bremsstrahlung X-rays generated by intense laser-plasma interactions using a 200 μm thickness SiO2 converter. The X-ray spectrum obtained with the Compton X-ray spectrometer is consistent with that obtained with a DET X-ray spectrometer, furthermore higher certainly of a spectral intensity is obtained with the Compton X-ray spectrometer than that with the DET X-ray spectrometer in the photon energy range above 5 MeV.

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