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J Appl Crystallogr. 2016 May 11;49:1057-1064. doi: 10.1107/S1600576716006683. eCollection 2016 Jun 01.

[No title available]

Journal of applied crystallography

Artem Y Lyubimov, Monarin Uervirojnangkoorn, Oliver B Zeldin, Aaron S Brewster, Thomas D Murray, Nicholas K Sauter, James M Berger, William I Weis, Axel T Brunger

Affiliations

  1. Department of Molecular and Cellular Physiology, Stanford University, 318 Campus Drive, Stanford, CA 94305, USA; Department of Neurology and Neurological Science, Stanford University, 318 Campus Drive, Stanford, CA 94305, USA; Department of Structural Biology, Stanford University, 318 Campus Drive, Stanford, CA 94305, USA; Department of Photon Science, Stanford University, 318 Campus Drive, Stanford, CA 94305, USA; Howard Hughes Medical Institute, Stanford University, Stanford, CA 94305, USA.
  2. Molecular Biophysics and Integrated Bioimaging Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
  3. Biophysics Graduate Group, University of California, Berkeley, CA 94720, USA; Department of Biophysics and Biophysical Chemistry, Johns Hopkins University School of Medicine, Baltimore, MD 21205, USA.
  4. Department of Biophysics and Biophysical Chemistry, Johns Hopkins University School of Medicine, Baltimore, MD 21205, USA.
  5. Department of Molecular and Cellular Physiology, Stanford University, 318 Campus Drive, Stanford, CA 94305, USA; Department of Structural Biology, Stanford University, 318 Campus Drive, Stanford, CA 94305, USA; Department of Photon Science, Stanford University, 318 Campus Drive, Stanford, CA 94305, USA.

PMID: 27275148 PMCID: PMC4886991 DOI: 10.1107/S1600576716006683

Abstract

Serial femtosecond crystallography (SFX) uses an X-ray free-electron laser to extract diffraction data from crystals not amenable to conventional X-ray light sources owing to their small size or radiation sensitivity. However, a limitation of SFX is the high variability of the diffraction images that are obtained. As a result, it is often difficult to determine optimal indexing and integration parameters for the individual diffraction images. Presented here is a software package, called

Keywords: X-ray free-electron lasers; XFELs; computer programs; diffraction data processing; indexing and integration; serial femtosecond crystallography

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