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Kilbane JD, Chan EM, Monachon C, et al. Far-field optical nanothermometry using individual sub-50 nm upconverting nanoparticles. Nanoscale. 2016;8(22):11611-6doi: 10.1039/c6nr01479h.
Kilbane, J. D., Chan, E. M., Monachon, C., Borys, N. J., Levy, E. S., Pickel, A. D., Urban, J. J., Schuck, P. J., & Dames, C. (2016). Far-field optical nanothermometry using individual sub-50 nm upconverting nanoparticles. Nanoscale, 8(22), 11611-6. https://doi.org/10.1039/c6nr01479h
Kilbane, Jacob D, et al. "Far-field optical nanothermometry using individual sub-50 nm upconverting nanoparticles." Nanoscale vol. 8,22 (2016): 11611-6. doi: https://doi.org/10.1039/c6nr01479h
Kilbane JD, Chan EM, Monachon C, Borys NJ, Levy ES, Pickel AD, Urban JJ, Schuck PJ, Dames C. Far-field optical nanothermometry using individual sub-50 nm upconverting nanoparticles. Nanoscale. 2016 Jun 02;8(22):11611-6. doi: 10.1039/c6nr01479h. PMID: 27216164.
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Nanoscale. 2016 Jun 02;8(22):11611-6. doi: 10.1039/c6nr01479h.

Far-field optical nanothermometry using individual sub-50 nm upconverting nanoparticles.

Nanoscale

Jacob D Kilbane, Emory M Chan, Christian Monachon, Nicholas J Borys, Elizabeth S Levy, Andrea D Pickel, Jeffrey J Urban, P James Schuck, Chris Dames

Affiliations

  1. Department of Mechanical Engineering, University of California, Berkeley, California 94720, USA. [email protected].
  2. The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.
  3. Department of Mechanical Engineering, University of California, Berkeley, California 94720, USA. [email protected] and The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.

PMID: 27216164 DOI: 10.1039/c6nr01479h

Abstract

We demonstrate far-field optical thermometry using individual NaYF4 nanoparticles doped with 2% Er(3+) and 20% Yb(3+). Isolated 20 × 20 × 40 nm(3) particles were identified using only far-field optical imaging, confirmed by subsequent scanning electron microscopy. The luminescence thermometry response for five such single particles was characterized for temperatures from 300 K to 400 K. A standard Arrhenius model widely used for larger particles can still be accurately applied to these sub-50 nm particles, with good particle-to-particle uniformity (response coefficients exhibited standard deviations below 5%). With its spatial resolution on the order of 50 nm when imaging a single particle, far below the diffraction limit, this technique has potential applications for both fundamental thermal measurements and nanoscale metrology in industrial applications.

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