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Deutsch M, Förster E, Hölzer G, et al. X-Ray Spectrometry of Copper: New Results on an Old Subject. J Res Natl Inst Stand Technol. 2004;109(1):75-98doi: 10.6028/jres.109.006.
Deutsch, M., Förster, E., Hölzer, G., Härtwig, J., Hämäläinen, K., Kao, C. C., Huotari, S., & Diamant, R. (2004). X-Ray Spectrometry of Copper: New Results on an Old Subject. Journal of research of the National Institute of Standards and Technology, 109(1), 75-98. https://doi.org/10.6028/jres.109.006
Deutsch, M, et al. "X-Ray Spectrometry of Copper: New Results on an Old Subject." Journal of research of the National Institute of Standards and Technology vol. 109,1 (2004): 75-98. doi: https://doi.org/10.6028/jres.109.006
Deutsch M, Förster E, Hölzer G, Härtwig J, Hämäläinen K, Kao CC, Huotari S, Diamant R. X-Ray Spectrometry of Copper: New Results on an Old Subject. J Res Natl Inst Stand Technol. 2004 Feb 01;109(1):75-98. doi: 10.6028/jres.109.006. Print 2004. PMID: 27366598; PMCID: PMC4849622.
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