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Microscopy (Oxf). 2016 Oct;65(5):391-399. doi: 10.1093/jmicro/dfw018. Epub 2016 Jun 21.

Detection of picometer-order atomic displacements in drift-compensated HAADF-STEM images of gold nanorods.

Microscopy (Oxford, England)

Kohei Aso, Koji Shigematsu, Tomokazu Yamamoto, Syo Matsumura

Affiliations

  1. Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Motooka 744, Nishi-ku, Fukuoka, Japan [email protected].
  2. Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Motooka 744, Nishi-ku, Fukuoka, Japan.
  3. Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Motooka 744, Nishi-ku, Fukuoka, Japan The Ultramicroscopy Research Center, Kyushu University, Motooka 744, Nishi-ku, Fukuoka, Japan.

PMID: 27334598 DOI: 10.1093/jmicro/dfw018

Abstract

Cs-corrected atomic resolution scanning transmission electron microscopy under a drift-compensated operation enabled us to acquire high-angle annular dark-field (HAADF) images of entire gold nanorods without distortion induced by specimen drift. The precision in locating the atomic columns was evaluated to be ±5 pm in the images thus obtained, which is comparable to the image pixel size. A high-precision HAADF image of a single-crystalline gold nanorod revealed that the tip portions at both ends tended to undergo outward displacements along the rod axis and inward contraction along the perpendicular direction. A single nanosecond pulse shot of laser light with a wavelength of 1064 nm and an average intensity of 7.3 kJ/m

© The Author 2016. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: [email protected].

Keywords: HAADF-STEM; atomic resolution electron microscopy; laser light irradiation; nanorods; picometer-order analysis

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