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Bajpai AK, Bhatt R, Katare R. Atomic force microscopy enabled roughness analysis of nanostructured poly (diaminonaphthalene) doped poly (vinyl alcohol) conducting polymer thin films. Micron. 2016;90:12-17doi: 10.1016/j.micron.2016.07.012.
Bajpai, A. K., Bhatt, R., & Katare, R. (2016). Atomic force microscopy enabled roughness analysis of nanostructured poly (diaminonaphthalene) doped poly (vinyl alcohol) conducting polymer thin films. Micron (Oxford, England : 1993), 9012-17. https://doi.org/10.1016/j.micron.2016.07.012
Bajpai, Anil Kumar, et al. "Atomic force microscopy enabled roughness analysis of nanostructured poly (diaminonaphthalene) doped poly (vinyl alcohol) conducting polymer thin films." Micron (Oxford, England : 1993) vol. 90 (2016): 12-17. doi: https://doi.org/10.1016/j.micron.2016.07.012
Bajpai AK, Bhatt R, Katare R. Atomic force microscopy enabled roughness analysis of nanostructured poly (diaminonaphthalene) doped poly (vinyl alcohol) conducting polymer thin films. Micron. 2016 Nov;90:12-17. doi: 10.1016/j.micron.2016.07.012. Epub 2016 Aug 11. PMID: 27544068.
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Micron. 2016 Nov;90:12-17. doi: 10.1016/j.micron.2016.07.012. Epub 2016 Aug 11.

Atomic force microscopy enabled roughness analysis of nanostructured poly (diaminonaphthalene) doped poly (vinyl alcohol) conducting polymer thin films.

Micron (Oxford, England : 1993)

Anil Kumar Bajpai, Rinkesh Bhatt, Ravi Katare

Affiliations

  1. Professor Bose Memorial Research Laboratory, Department of Chemistry, Government Autonomous Science College, Jabalpur, M.P, India. Electronic address: [email protected].
  2. Associate Professor Department of Physics, Global Engineering College, Jabalpur, M.P, India.
  3. Professor Department of Physics, Government Autonomous Science College, Jabalpur, M.P, India.

PMID: 27544068 DOI: 10.1016/j.micron.2016.07.012

Abstract

The Atomic Force Microscopy (AFM) helps in evaluating parameters like amplitude or height parameters, functional or statistical parameters and spatial parameters which describe the surface topography or the roughness. In this paper, we have evaluated the roughness parameters for the native poly (vinyl alcohol) (PVA), monomer diaminonaphthalene (DAN) doped PVA, and poly (diaminonaphthalene) (PDAN) doped PVA films prepared in different solvents. In addition, distribution of heights, skewness and Kurtosis moments which describe surface asymmetry and flatness properties of a film were also determined. At the same time line profiles, 3D and 2D images of the surface structures at different scanning areas i.e. 5×5μm

Copyright © 2016 Elsevier Ltd. All rights reserved.

Keywords: Atomic force microscopy; Coefficient of kurtosis; Surface skewness

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