Cite
Kuriyama M, Dobbyn RC, Spal RD, et al. Hard X-Ray Microscope With Submicrometer Spatial Resolution. J Res Natl Inst Stand Technol. 1990;95(5):559-574doi: 10.6028/jres.095.044.
Kuriyama, M., Dobbyn, R. C., Spal, R. D., Burdette, H. E., & Black, D. R. (1990). Hard X-Ray Microscope With Submicrometer Spatial Resolution. Journal of research of the National Institute of Standards and Technology, 95(5), 559-574. https://doi.org/10.6028/jres.095.044
Kuriyama, Masao, et al. "Hard X-Ray Microscope With Submicrometer Spatial Resolution." Journal of research of the National Institute of Standards and Technology vol. 95,5 (1990): 559-574. doi: https://doi.org/10.6028/jres.095.044
Kuriyama M, Dobbyn RC, Spal RD, Burdette HE, Black DR. Hard X-Ray Microscope With Submicrometer Spatial Resolution. J Res Natl Inst Stand Technol. 1990 Sep-Oct;95(5):559-574. doi: 10.6028/jres.095.044. PMID: 28179792; PMCID: PMC4930020.
Copy
Download .nbib