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Lettieri TR, Hartman AW, Hembree GG, et al. Certification of SRM1960: Nominal 10 μm Diameter Polystyrene Spheres ("Space Beads"). J Res Natl Inst Stand Technol. 1991;96(6):669-691doi: 10.6028/jres.096.044.
Lettieri, T. R., Hartman, A. W., Hembree, G. G., & Marx, E. (1991). Certification of SRM1960: Nominal 10 μm Diameter Polystyrene Spheres ("Space Beads"). Journal of research of the National Institute of Standards and Technology, 96(6), 669-691. https://doi.org/10.6028/jres.096.044
Lettieri, Thomas R, et al. "Certification of SRM1960: Nominal 10 μm Diameter Polystyrene Spheres ("Space Beads")." Journal of research of the National Institute of Standards and Technology vol. 96,6 (1991): 669-691. doi: https://doi.org/10.6028/jres.096.044
Lettieri TR, Hartman AW, Hembree GG, Marx E. Certification of SRM1960: Nominal 10 μm Diameter Polystyrene Spheres ("Space Beads"). J Res Natl Inst Stand Technol. 1991 Nov-Dec;96(6):669-691. doi: 10.6028/jres.096.044. PMID: 28184141; PMCID: PMC4915770.
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J Res Natl Inst Stand Technol. 1991 Nov-Dec;96(6):669-691. doi: 10.6028/jres.096.044.

Certification of SRM1960: Nominal 10 μm Diameter Polystyrene Spheres ("Space Beads").

Journal of research of the National Institute of Standards and Technology

Thomas R Lettieri, Arie W Hartman, Gary G Hembree, Egon Marx

Affiliations

  1. National Institute of Standards and Technology, Gaithersburg, MD 20899.

PMID: 28184141 PMCID: PMC4915770 DOI: 10.6028/jres.096.044

Abstract

Experimental, theoretical, and calculational details are presented for the three independent micrometrology techniques used to certify the mean diameter of Standard Reference Materisd 1960, nominal 10 μm diameter polystyrene spheres ("space beads"). The mean diameters determined by the three techniques agreed remarkably well, with all measurements within 0.1% of each other, an unprecedented achievement in the dimensional metrology of microspheres. Center distance finding (CDF), a method based on optical microscopy, gave a value of 9.89 ± 0.04 μm, which was chosen to be the certified mean diameter. The supporting measurements were done using metrology electron microscopy (MEM) and resonance light scattering (RLS). The MEM technique, based on scanning electron microscopy, yielded 9.89±0.06 μm for the mean diameter of the microspheres in vacuum, while the RLS value was 9.90 ±0.03 μm for the microspheres in liquid suspension. The main peak of the diameter distribution for SRM 1960 is nearly Gaussian with a certified standard deviation of 0.09 μm, as determined by CDF. Off the main peak, there are about 1% oversized particles and a negligible amount of undersized particles. The report gives a detailed description of the apparatus, the experimental methods, the data-reduction techniques, and an error analysis for each of the micro-metrology techniques. A distinctive characteristic of this SRM is that it was manufactured in microgravity aboard the NASA space shuttle Challenger and is the first commercial product to be made in space.

Keywords: Electron microscopy; length; light scattering; metrology; microgravity; micrometrology; microscopy; microspheres; particle sizing; particles; polystyrene spheres; reference materials; sizing; standards

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