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Piazza A, Giannazzo F, Buscarino G, et al. In-situ monitoring by Raman spectroscopy of the thermal doping of graphene and MoS. Beilstein J Nanotechnol. 2017;8:418-424doi: 10.3762/bjnano.8.44.
Piazza, A., Giannazzo, F., Buscarino, G., Fisichella, G., Magna, A., Roccaforte, F., Cannas, M., Gelardi, F. M., & Agnello, S. (2017). In-situ monitoring by Raman spectroscopy of the thermal doping of graphene and MoS. Beilstein journal of nanotechnology, 8418-424. https://doi.org/10.3762/bjnano.8.44
Piazza, Aurora, et al. "In-situ monitoring by Raman spectroscopy of the thermal doping of graphene and MoS." Beilstein journal of nanotechnology vol. 8 (2017): 418-424. doi: https://doi.org/10.3762/bjnano.8.44
Piazza A, Giannazzo F, Buscarino G, Fisichella G, Magna A, Roccaforte F, Cannas M, Gelardi FM, Agnello S. In-situ monitoring by Raman spectroscopy of the thermal doping of graphene and MoS. Beilstein J Nanotechnol. 2017 Feb 10;8:418-424. doi: 10.3762/bjnano.8.44. eCollection 2017. PMID: 28326231; PMCID: PMC5331249.
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