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Williams RM, Aalseth CE, Brandenberger JM, et al. Development of a low-level . Appl Radiat Isot. 2017;126:243-248doi: 10.1016/j.apradiso.2017.02.018.
Williams, R. M., Aalseth, C. E., Brandenberger, J. M., Day, A. R., Finn, E., Fuller, E. S., Hoppe, E. W., Humble, P. H., Keillor, M. E., Mace, E. K., Myers, A. W., Overman, C. T., Panisko, M. E., Seifert, A., & White, S. K. (2017). Development of a low-level . Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine, 126243-248. https://doi.org/10.1016/j.apradiso.2017.02.018
Williams, R M, et al. "Development of a low-level ." Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine vol. 126 (2017): 243-248. doi: https://doi.org/10.1016/j.apradiso.2017.02.018
Williams RM, Aalseth CE, Brandenberger JM, Day AR, Finn E, Fuller ES, Hoppe EW, Humble PH, Keillor ME, Mace EK, Myers AW, Overman CT, Panisko ME, Seifert A, White SK. Development of a low-level . Appl Radiat Isot. 2017 Aug;126:243-248. doi: 10.1016/j.apradiso.2017.02.018. Epub 2017 Feb 17. PMID: 28236555.
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Appl Radiat Isot. 2017 Aug;126:243-248. doi: 10.1016/j.apradiso.2017.02.018. Epub 2017 Feb 17.

Development of a low-level .

Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine

R M Williams, C E Aalseth, J M Brandenberger, A R Day, E Finn, E S Fuller, E W Hoppe, P H Humble, M E Keillor, E K Mace, A W Myers, C T Overman, M E Panisko, A Seifert, S K White

Affiliations

  1. Pacific Northwest National Laboratory, PO Box 999, Richland, WA 99352, USA. Electronic address: [email protected].
  2. Pacific Northwest National Laboratory, PO Box 999, Richland, WA 99352, USA.

PMID: 28236555 DOI: 10.1016/j.apradiso.2017.02.018

Abstract

This paper describes the generation of

Copyright © 2017. Published by Elsevier Ltd.

Keywords: Absolute radiation measurement; Electroformed copper; Length compensated proportional counting; Ultra-low background; Uncertainty Analysis

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