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Zhou L, Cai M, Tong T, et al. Progress in the Correlative Atomic Force Microscopy and Optical Microscopy. Sensors (Basel). 2017;17(4)doi: 10.3390/s17040938.
Zhou, L., Cai, M., Tong, T., & Wang, H. (2017). Progress in the Correlative Atomic Force Microscopy and Optical Microscopy. Sensors (Basel, Switzerland), 17(4), . https://doi.org/10.3390/s17040938
Zhou, Lulu, et al. "Progress in the Correlative Atomic Force Microscopy and Optical Microscopy." Sensors (Basel, Switzerland) vol. 17,4 (2017). doi: https://doi.org/10.3390/s17040938
Zhou L, Cai M, Tong T, Wang H. Progress in the Correlative Atomic Force Microscopy and Optical Microscopy. Sensors (Basel). 2017 Apr 24;17(4). doi: 10.3390/s17040938. PMID: 28441775; PMCID: PMC5426934.
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