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Kushner DI, Hickner MA. Water Sorption in Electron-Beam Evaporated SiO. Langmuir. 2017;33(21):5261-5268doi: 10.1021/acs.langmuir.7b00759.
Kushner, D. I., & Hickner, M. A. (2017). Water Sorption in Electron-Beam Evaporated SiO. Langmuir : the ACS journal of surfaces and colloids, 33(21), 5261-5268. https://doi.org/10.1021/acs.langmuir.7b00759
Kushner, Douglas I, and Hickner, Michael A. "Water Sorption in Electron-Beam Evaporated SiO." Langmuir : the ACS journal of surfaces and colloids vol. 33,21 (2017): 5261-5268. doi: https://doi.org/10.1021/acs.langmuir.7b00759
Kushner DI, Hickner MA. Water Sorption in Electron-Beam Evaporated SiO. Langmuir. 2017 May 30;33(21):5261-5268. doi: 10.1021/acs.langmuir.7b00759. Epub 2017 May 15. PMID: 28474891.
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Langmuir. 2017 May 30;33(21):5261-5268. doi: 10.1021/acs.langmuir.7b00759. Epub 2017 May 15.

Water Sorption in Electron-Beam Evaporated SiO.

Langmuir : the ACS journal of surfaces and colloids

Douglas I Kushner, Michael A Hickner

Affiliations

  1. Department of Materials Science and Engineering, The Pennsylvania State University , University Park, Pennsylvania 16802, United States.

PMID: 28474891 DOI: 10.1021/acs.langmuir.7b00759

Abstract

Spectroscopic ellipsometry (SE) and quartz crystal microbalance (QCM) measurements are two critical characterization techniques routinely employed for hydration studies of polymer thin films. Water uptake by thin polymer films is an important area of study to investigate antifouling surfaces, to probe the swelling of thin water-containing ionomer films, and to conduct fundamental studies of polymer brush hydration and swelling. SiO

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