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Kim JJ, Joo SH, Lee KS, et al. Improved design for a low temperature scanning tunneling microscope with an in situ tip treatment stage. Rev Sci Instrum. 2017;88(4):043702doi: 10.1063/1.4979928.
Kim, J. J., Joo, S. H., Lee, K. S., Yoo, J. H., Park, M. S., Kwak, J. S., & Lee, J. (2017). Improved design for a low temperature scanning tunneling microscope with an in situ tip treatment stage. The Review of scientific instruments, 88(4), 043702. https://doi.org/10.1063/1.4979928
Kim, J-J, et al. "Improved design for a low temperature scanning tunneling microscope with an in situ tip treatment stage." The Review of scientific instruments vol. 88,4 (2017): 043702. doi: https://doi.org/10.1063/1.4979928
Kim JJ, Joo SH, Lee KS, Yoo JH, Park MS, Kwak JS, Lee J. Improved design for a low temperature scanning tunneling microscope with an in situ tip treatment stage. Rev Sci Instrum. 2017 Apr;88(4):043702. doi: 10.1063/1.4979928. PMID: 28456260.
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Rev Sci Instrum. 2017 Apr;88(4):043702. doi: 10.1063/1.4979928.

Improved design for a low temperature scanning tunneling microscope with an in situ tip treatment stage.

The Review of scientific instruments

J-J Kim, S H Joo, K S Lee, J H Yoo, M S Park, J S Kwak, Jinho Lee

Affiliations

  1. Department of Physics and Astronomy, Institute of Applied Physics, Seoul National University, Seoul 08826, South Korea and Center for Correlated Electron Systems, Institute for Basic Science(IBS), Seoul 08826, South Korea.

PMID: 28456260 DOI: 10.1063/1.4979928

Abstract

The Low Temperature Scanning Tunneling Microscope (LT-STM) is an extremely valuable tool not only in surface science but also in condensed matter physics. For years, numerous new ideas have been adopted to perfect LT-STM performances-Ultra-Low Vibration (ULV) laboratory and the rigid STM head design are among them. Here, we present three improvements for the design of the ULV laboratory and the LT-STM: tip treatment stage, sample cleaving stage, and vibration isolation system. The improved tip treatment stage enables us to perform field emission for the purpose of tip treatment in situ without exchanging samples, while our enhanced sample cleaving stage allows us to cleave samples at low temperature in a vacuum without optical access by a simple pressing motion. Our newly designed vibration isolation system provides efficient space usage while maintaining vibration isolation capability. These improvements enhance the quality of spectroscopic imaging experiments that can last for many days and provide increased data yield, which we expect can be indispensable elements in future LT-STM designs.

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