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Kondratov AV, Rogov OY, Gainutdinov RV. AFM reconstruction of complex-shaped chiral plasmonic nanostructures. Ultramicroscopy. 2017;181:81-85doi: 10.1016/j.ultramic.2017.05.013.
Kondratov, A. V., Rogov, O. Y., & Gainutdinov, R. V. (2017). AFM reconstruction of complex-shaped chiral plasmonic nanostructures. Ultramicroscopy, 18181-85. https://doi.org/10.1016/j.ultramic.2017.05.013
Kondratov, A V, et al. "AFM reconstruction of complex-shaped chiral plasmonic nanostructures." Ultramicroscopy vol. 181 (2017): 81-85. doi: https://doi.org/10.1016/j.ultramic.2017.05.013
Kondratov AV, Rogov OY, Gainutdinov RV. AFM reconstruction of complex-shaped chiral plasmonic nanostructures. Ultramicroscopy. 2017 Oct;181:81-85. doi: 10.1016/j.ultramic.2017.05.013. Epub 2017 May 11. PMID: 28527313.
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Ultramicroscopy. 2017 Oct;181:81-85. doi: 10.1016/j.ultramic.2017.05.013. Epub 2017 May 11.

AFM reconstruction of complex-shaped chiral plasmonic nanostructures.

Ultramicroscopy

A V Kondratov, O Y Rogov, R V Gainutdinov

Affiliations

  1. Shubnikov Institute of Crystallography of Federal Scientific Research Centre "Crystallography and Photonics" of Russian Academy of Sciences, 119333 Moscow, Russia. Electronic address: [email protected].
  2. Shubnikov Institute of Crystallography of Federal Scientific Research Centre "Crystallography and Photonics" of Russian Academy of Sciences, 119333 Moscow, Russia.

PMID: 28527313 DOI: 10.1016/j.ultramic.2017.05.013

Abstract

A significant part of the optical metamaterial phenomena has the plasmonic nature and their investigation requires very accurate knowledge of the fabricated structures shape with a focus on the periodical features. We describe a consistent approach to the shape reconstruction of the plasmonic nanostructures. This includes vertical and tilted spike AFM probes fabrication, AFM imaging and specific post-processing. We studied a complex-shaped chiral metamaterial and conclude that the described post-processing routine extends possibilities of the existing deconvolution algorithms in the case of periodical structures with known rotational symmetry, by providing valuable information about periodical features.

Copyright © 2017 Elsevier B.V. All rights reserved.

Keywords: Atomic force microscopy; Focused ion beam; Plasmonic structures; Post-processing

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