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Blase RC, Benke RR, Miller GP, et al. Microchannel plate detector detection efficiency to monoenergetic electrons between 3 and 28 keV. Rev Sci Instrum. 2017;88(5):053302doi: 10.1063/1.4983338.
Blase, R. C., Benke, R. R., Miller, G. P., Pickens, K. S., & Waite, J. H. (2017). Microchannel plate detector detection efficiency to monoenergetic electrons between 3 and 28 keV. The Review of scientific instruments, 88(5), 053302. https://doi.org/10.1063/1.4983338
Blase, Ryan C, et al. "Microchannel plate detector detection efficiency to monoenergetic electrons between 3 and 28 keV." The Review of scientific instruments vol. 88,5 (2017): 053302. doi: https://doi.org/10.1063/1.4983338
Blase RC, Benke RR, Miller GP, Pickens KS, Waite JH. Microchannel plate detector detection efficiency to monoenergetic electrons between 3 and 28 keV. Rev Sci Instrum. 2017 May;88(5):053302. doi: 10.1063/1.4983338. PMID: 28571456.
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Rev Sci Instrum. 2017 May;88(5):053302. doi: 10.1063/1.4983338.

Microchannel plate detector detection efficiency to monoenergetic electrons between 3 and 28 keV.

The Review of scientific instruments

Ryan C Blase, Roland R Benke, Gregory P Miller, Keith S Pickens, J Hunter Waite

Affiliations

  1. Space Science and Engineering Division, Southwest Research Institute, San Antonio, Texas 78238, USA.

PMID: 28571456 DOI: 10.1063/1.4983338

Abstract

An unshielded microchannel plate (MCP) detector with an ultrafine pore diameter of 2 μm was irradiated by an electron beam to determine the detection efficiency of electrons for creating detector signals, or counts. Tested electron energies spanned a range of 3 kiloelectron volts (keV) to 28 keV. Higher detection efficiencies were measured at the lower end of this energy range, 0.376 counts per incident electron at 3 keV down to 0.155 at 15 keV with an increase to 0.217 at 18 keV and then another decrease down to 0.15 counts per incident electron at 28 keV. The increase at 18 keV is attributed to primary electron interaction with the L shell electrons of lead (Pb), leading to an increase in secondary electron and X-ray generation within the MCP and thus an increase in detection efficiency. For the electron beam directed normal to the MCP surface, the lowest efficiency of 0.15 counts per incident electron was observed at 28 keV. Detection efficiency was also tested as a function of incident angle with angular steps of 5°. Detection efficiency was more sensitive to the angle of incidence as the incident electron energy decreased. The detection efficiency at 3 keV decreased from 0.376 counts per electron at the zero degree angle (normal incidence to MCP surface) to 0.027 counts per electron at an incident angle of 50° (average in both orientations). At 28 keV, the decrease in detection efficiency as a function of increasing angle was less pronounced, ranging from 0.15 counts per electron at zero degrees to 0.08 counts per electron at 50° (average in both orientations). Experimental data showed lower detection efficiencies compared with previously published data.

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