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Liu H, Wolf M, Karki K, et al. Intergranular Cracking as a Major Cause of Long-Term Capacity Fading of Layered Cathodes. Nano Lett. 2017;17(6):3452-3457doi: 10.1021/acs.nanolett.7b00379.
Liu, H., Wolf, M., Karki, K., Yu, Y. S., Stach, E. A., Cabana, J., Chapman, K. W., & Chupas, P. J. (2017). Intergranular Cracking as a Major Cause of Long-Term Capacity Fading of Layered Cathodes. Nano letters, 17(6), 3452-3457. https://doi.org/10.1021/acs.nanolett.7b00379
Liu, Hao, et al. "Intergranular Cracking as a Major Cause of Long-Term Capacity Fading of Layered Cathodes." Nano letters vol. 17,6 (2017): 3452-3457. doi: https://doi.org/10.1021/acs.nanolett.7b00379
Liu H, Wolf M, Karki K, Yu YS, Stach EA, Cabana J, Chapman KW, Chupas PJ. Intergranular Cracking as a Major Cause of Long-Term Capacity Fading of Layered Cathodes. Nano Lett. 2017 Jun 14;17(6):3452-3457. doi: 10.1021/acs.nanolett.7b00379. Epub 2017 Jun 01. PMID: 28548836.
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