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Cao M, Nishi R, Wang F. Automatic system for electron tomography data collection in the ultra-high voltage electron microscope. Micron. 2017;103:29-33doi: 10.1016/j.micron.2017.09.006.
Cao, M., Nishi, R., & Wang, F. (2017). Automatic system for electron tomography data collection in the ultra-high voltage electron microscope. Micron (Oxford, England : 1993), 10329-33. https://doi.org/10.1016/j.micron.2017.09.006
Cao, Meng, et al. "Automatic system for electron tomography data collection in the ultra-high voltage electron microscope." Micron (Oxford, England : 1993) vol. 103 (2017): 29-33. doi: https://doi.org/10.1016/j.micron.2017.09.006
Cao M, Nishi R, Wang F. Automatic system for electron tomography data collection in the ultra-high voltage electron microscope. Micron. 2017 Dec;103:29-33. doi: 10.1016/j.micron.2017.09.006. Epub 2017 Sep 12. PMID: 28946024.
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Micron. 2017 Dec;103:29-33. doi: 10.1016/j.micron.2017.09.006. Epub 2017 Sep 12.

Automatic system for electron tomography data collection in the ultra-high voltage electron microscope.

Micron (Oxford, England : 1993)

Meng Cao, Ryuji Nishi, Fang Wang

Affiliations

  1. Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Department of Electronic Science and Technology, Xi'an Jiaotong University, Xi'an 710049, PR China; Research Centre for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan. Electronic address: [email protected].
  2. Research Centre for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan.
  3. Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Department of Electronic Science and Technology, Xi'an Jiaotong University, Xi'an 710049, PR China.

PMID: 28946024 DOI: 10.1016/j.micron.2017.09.006

Abstract

In this study, we report an automatic system for collection of tilt series for electron tomography based on the ultra-HVEM in Osaka University. By remotely controlling the microscope and reading the observation image, the system can track the field of view and do focus in each tilt angle. The automatic tracking is carried out with an image matching technique based on normalized correlation coefficient. Auto focus is realized by the optimization of image sharpness. A toolkit that can expand the field of view with technique of image stitching is also developed. The system can automatically collect the tilt series with much smaller time consumption.

Copyright © 2017 Elsevier Ltd. All rights reserved.

Keywords: Auto focus; Auto tracking; Data collection; Electron tomography; Image stitching

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