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Titov K, Zeng Z, Ryder MR, et al. Probing Dielectric Properties of Metal-Organic Frameworks: MIL-53(Al) as a Model System for Theoretical Predictions and Experimental Measurements via Synchrotron Far- and Mid-Infrared Spectroscopy. J Phys Chem Lett. 2017;8(20):5035-5040doi: 10.1021/acs.jpclett.7b02003.
Titov, K., Zeng, Z., Ryder, M. R., Chaudhari, A. K., Civalleri, B., Kelley, C. S., Frogley, M. D., Cinque, G., & Tan, J. C. (2017). Probing Dielectric Properties of Metal-Organic Frameworks: MIL-53(Al) as a Model System for Theoretical Predictions and Experimental Measurements via Synchrotron Far- and Mid-Infrared Spectroscopy. The journal of physical chemistry letters, 8(20), 5035-5040. https://doi.org/10.1021/acs.jpclett.7b02003
Titov, Kirill, et al. "Probing Dielectric Properties of Metal-Organic Frameworks: MIL-53(Al) as a Model System for Theoretical Predictions and Experimental Measurements via Synchrotron Far- and Mid-Infrared Spectroscopy." The journal of physical chemistry letters vol. 8,20 (2017): 5035-5040. doi: https://doi.org/10.1021/acs.jpclett.7b02003
Titov K, Zeng Z, Ryder MR, Chaudhari AK, Civalleri B, Kelley CS, Frogley MD, Cinque G, Tan JC. Probing Dielectric Properties of Metal-Organic Frameworks: MIL-53(Al) as a Model System for Theoretical Predictions and Experimental Measurements via Synchrotron Far- and Mid-Infrared Spectroscopy. J Phys Chem Lett. 2017 Oct 19;8(20):5035-5040. doi: 10.1021/acs.jpclett.7b02003. Epub 2017 Oct 04. PMID: 28953390.
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J Phys Chem Lett. 2017 Oct 19;8(20):5035-5040. doi: 10.1021/acs.jpclett.7b02003. Epub 2017 Oct 04.

Probing Dielectric Properties of Metal-Organic Frameworks: MIL-53(Al) as a Model System for Theoretical Predictions and Experimental Measurements via Synchrotron Far- and Mid-Infrared Spectroscopy.

The journal of physical chemistry letters

Kirill Titov, Zhixin Zeng, Matthew R Ryder, Abhijeet K Chaudhari, Bartolomeo Civalleri, Chris S Kelley, Mark D Frogley, Gianfelice Cinque, Jin-Chong Tan

Affiliations

  1. Multifunctional Materials and Composites (MMC) Laboratory, Department of Engineering Science, University of Oxford , Parks Road, Oxford OX1 3PJ, United Kingdom.
  2. Department of Chemistry, NIS and INSTM Reference Centre, University of Turin , via Pietro Giuria 7, 10125 Torino, Italy.
  3. Diamond Light Source , Harwell Campus, Chilton, Oxford OX11 0DE, United Kingdom.

PMID: 28953390 DOI: 10.1021/acs.jpclett.7b02003

Abstract

Emerging nanoporous materials, such as metal-organic frameworks (MOFs), are promising low-k dielectrics central to next-generation electronics and high-speed communication. Hitherto, the dielectric characterization of MOFs is scarce, with very limited experimental data for guiding new materials design and synthesis. Herein we demonstrate the efficacy of high-resolution synchrotron infrared (IR) specular reflectance experiments to study the dynamic dielectric properties of a flexible MOF structure: bistable MIL-53(Al) that exhibits switching between a large pore (LP) and a narrow pore (NP) architecture. We show that the ratio of LP:NP content of a polycrystalline sample can be changed via increased mechanical stress applied for pelletizing the MIL-53(Al) powder. We quantify the frequency-dependent dielectric constants over ∼1 to 120 THz, identifying all dielectric transitions as a function of stress and phase mixtures, showing how porosity modifies MOF's dielectric properties.

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