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Karge L, Gilles R, Busch S. Calibrating SANS data for instrument geometry and pixel sensitivity effects: access to an extended . J Appl Crystallogr. 2017;50:1382-1394doi: 10.1107/S1600576717011463.
Karge, L., Gilles, R., & Busch, S. (2017). Calibrating SANS data for instrument geometry and pixel sensitivity effects: access to an extended . Journal of applied crystallography, 501382-1394. https://doi.org/10.1107/S1600576717011463
Karge, Lukas, et al. "Calibrating SANS data for instrument geometry and pixel sensitivity effects: access to an extended ." Journal of applied crystallography vol. 50 (2017): 1382-1394. doi: https://doi.org/10.1107/S1600576717011463
Karge L, Gilles R, Busch S. Calibrating SANS data for instrument geometry and pixel sensitivity effects: access to an extended . J Appl Crystallogr. 2017 Sep 14;50:1382-1394. doi: 10.1107/S1600576717011463. eCollection 2017 Oct 01. PMID: 29021734; PMCID: PMC5627681.
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