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J Appl Crystallogr. 2017 Sep 14;50:1382-1394. doi: 10.1107/S1600576717011463. eCollection 2017 Oct 01.

Calibrating SANS data for instrument geometry and pixel sensitivity effects: access to an extended .

Journal of applied crystallography

Lukas Karge, Ralph Gilles, Sebastian Busch

Affiliations

  1. Heinz Maier-Leibnitz Zentrum (MLZ), Technische Universität München, Lichtenbergstrasse 1, 85747 Garching bei München, Germany.
  2. German Engineering Materials Science Centre (GEMS) at Heinz Maier-Leibnitz Zentrum (MLZ), Helmholtz-Zentrum Geesthacht, Lichtenbergstrasse 1, 85747 Garching bei München, Germany.

PMID: 29021734 PMCID: PMC5627681 DOI: 10.1107/S1600576717011463

Abstract

An improved data-reduction procedure is proposed and demonstrated for small-angle neutron scattering (SANS) measurements. Its main feature is the correction of geometry- and wavelength-dependent intensity variations on the detector in a separate step from the different pixel sensitivities: the geometric and wavelength effects can be corrected analytically, while pixel sensitivities have to be calibrated to a reference measurement. The geometric effects are treated for position-sensitive

Keywords: calibration; corrections; data reduction; small-angle neutron scattering

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