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Bae JY, Lee KS, Hur H, et al. 3D Defect Localization on Exothermic Faults within Multi-Layered Structures Using Lock-In Thermography: An Experimental and Numerical Approach. Sensors (Basel). 2017;17(10)doi: 10.3390/s17102331.
Bae, J. Y., Lee, K. S., Hur, H., Nam, K. H., Hong, S. J., Lee, A. Y., Chang, K. S., Kim, G. H., & Kim, G. (2017). 3D Defect Localization on Exothermic Faults within Multi-Layered Structures Using Lock-In Thermography: An Experimental and Numerical Approach. Sensors (Basel, Switzerland), 17(10), . https://doi.org/10.3390/s17102331
Bae, Ji Yong, et al. "3D Defect Localization on Exothermic Faults within Multi-Layered Structures Using Lock-In Thermography: An Experimental and Numerical Approach." Sensors (Basel, Switzerland) vol. 17,10 (2017). doi: https://doi.org/10.3390/s17102331
Bae JY, Lee KS, Hur H, Nam KH, Hong SJ, Lee AY, Chang KS, Kim GH, Kim G. 3D Defect Localization on Exothermic Faults within Multi-Layered Structures Using Lock-In Thermography: An Experimental and Numerical Approach. Sensors (Basel). 2017 Oct 13;17(10). doi: 10.3390/s17102331. PMID: 29027955; PMCID: PMC5677311.
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