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Muir R, Heebner J. Single-shot optical recorder with sub-picosecond resolution and scalable record length on a semiconductor wafer. Opt Lett. 2017;42(21):4414-4417doi: 10.1364/OL.42.004414.
Muir, R., & Heebner, J. (2017). Single-shot optical recorder with sub-picosecond resolution and scalable record length on a semiconductor wafer. Optics letters, 42(21), 4414-4417. https://doi.org/10.1364/OL.42.004414
Muir, R, and Heebner, J. "Single-shot optical recorder with sub-picosecond resolution and scalable record length on a semiconductor wafer." Optics letters vol. 42,21 (2017): 4414-4417. doi: https://doi.org/10.1364/OL.42.004414
Muir R, Heebner J. Single-shot optical recorder with sub-picosecond resolution and scalable record length on a semiconductor wafer. Opt Lett. 2017 Nov 01;42(21):4414-4417. doi: 10.1364/OL.42.004414. PMID: 29088180.
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Opt Lett. 2017 Nov 01;42(21):4414-4417. doi: 10.1364/OL.42.004414.

Single-shot optical recorder with sub-picosecond resolution and scalable record length on a semiconductor wafer.

Optics letters

R Muir, J Heebner

PMID: 29088180 DOI: 10.1364/OL.42.004414

Abstract

We demonstrate a novel, single-shot recording technology for transient optical signals. A resolution of 0.4 ps over a record length of 54 ps was demonstrated. Here, a pump pulse crossing through a signal samples a diagonal "slice" of space-time, enabling a camera to record spatially the time content of the signal. Unlike related χ

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