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Li C, Habler G, Baldwin LC, et al. An improved FIB sample preparation technique for site-specific plan-view specimens: A new cutting geometry. Ultramicroscopy. 2017;184:310-317doi: 10.1016/j.ultramic.2017.09.011.
Li, C., Habler, G., Baldwin, L. C., & Abart, R. (2018). An improved FIB sample preparation technique for site-specific plan-view specimens: A new cutting geometry. Ultramicroscopy, 184310-317. https://doi.org/10.1016/j.ultramic.2017.09.011
Li, Chen, et al. "An improved FIB sample preparation technique for site-specific plan-view specimens: A new cutting geometry." Ultramicroscopy vol. 184 (2018): 310-317. doi: https://doi.org/10.1016/j.ultramic.2017.09.011
Li C, Habler G, Baldwin LC, Abart R. An improved FIB sample preparation technique for site-specific plan-view specimens: A new cutting geometry. Ultramicroscopy. 2018 Jan;184:310-317. doi: 10.1016/j.ultramic.2017.09.011. Epub 2017 Sep 28. PMID: 29096249.
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