Cite
Friedrich T, Bochmann A, Dinger J, et al. Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulations. Ultramicroscopy. 2017;184:44-51doi: 10.1016/j.ultramic.2017.10.006.
Friedrich, T., Bochmann, A., Dinger, J., & Teichert, S. (2018). Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulations. Ultramicroscopy, 18444-51. https://doi.org/10.1016/j.ultramic.2017.10.006
Friedrich, T, et al. "Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulations." Ultramicroscopy vol. 184 (2018): 44-51. doi: https://doi.org/10.1016/j.ultramic.2017.10.006
Friedrich T, Bochmann A, Dinger J, Teichert S. Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulations. Ultramicroscopy. 2018 Jan;184:44-51. doi: 10.1016/j.ultramic.2017.10.006. Epub 2017 Oct 12. PMID: 29096393.
Copy
Download .nbib