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Śmietana M, Janik M, Koba M, et al. Transition between bulk and surface refractive index sensitivity of micro-cavity in-line Mach-Zehnder interferometer induced by thin film deposition. Opt Express. 2017;25(21):26118-26123doi: 10.1364/OE.25.026118.
Śmietana, M., Janik, M., Koba, M., & Bock, W. J. (2017). Transition between bulk and surface refractive index sensitivity of micro-cavity in-line Mach-Zehnder interferometer induced by thin film deposition. Optics express, 25(21), 26118-26123. https://doi.org/10.1364/OE.25.026118
Śmietana, Mateusz, et al. "Transition between bulk and surface refractive index sensitivity of micro-cavity in-line Mach-Zehnder interferometer induced by thin film deposition." Optics express vol. 25,21 (2017): 26118-26123. doi: https://doi.org/10.1364/OE.25.026118
Śmietana M, Janik M, Koba M, Bock WJ. Transition between bulk and surface refractive index sensitivity of micro-cavity in-line Mach-Zehnder interferometer induced by thin film deposition. Opt Express. 2017 Oct 16;25(21):26118-26123. doi: 10.1364/OE.25.026118. PMID: 29041272.
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