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Zdora MC, Zanette I, Zhou T, et al. At-wavelength optics characterisation via X-ray speckle- and grating-based unified modulated pattern analysis. Opt Express. 2018;26(4):4989-5004doi: 10.1364/OE.26.004989.
Zdora, M. C., Zanette, I., Zhou, T., Koch, F. J., Romell, J., Sala, S., Last, A., Ohishi, Y., Hirao, N., Rau, C., & Thibault, P. (2018). At-wavelength optics characterisation via X-ray speckle- and grating-based unified modulated pattern analysis. Optics express, 26(4), 4989-5004. https://doi.org/10.1364/OE.26.004989
Zdora, Marie-Christine, et al. "At-wavelength optics characterisation via X-ray speckle- and grating-based unified modulated pattern analysis." Optics express vol. 26,4 (2018): 4989-5004. doi: https://doi.org/10.1364/OE.26.004989
Zdora MC, Zanette I, Zhou T, Koch FJ, Romell J, Sala S, Last A, Ohishi Y, Hirao N, Rau C, Thibault P. At-wavelength optics characterisation via X-ray speckle- and grating-based unified modulated pattern analysis. Opt Express. 2018 Feb 19;26(4):4989-5004. doi: 10.1364/OE.26.004989. PMID: 29475342.
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