Cite
Miyagi A, Scheuring S. A novel phase-shift-based amplitude detector for a high-speed atomic force microscope. Rev Sci Instrum. 2018;89(8):083704doi: 10.1063/1.5038095.
Miyagi, A., & Scheuring, S. (2018). A novel phase-shift-based amplitude detector for a high-speed atomic force microscope. The Review of scientific instruments, 89(8), 083704. https://doi.org/10.1063/1.5038095
Miyagi, Atsushi, and Scheuring, Simon. "A novel phase-shift-based amplitude detector for a high-speed atomic force microscope." The Review of scientific instruments vol. 89,8 (2018): 083704. doi: https://doi.org/10.1063/1.5038095
Miyagi A, Scheuring S. A novel phase-shift-based amplitude detector for a high-speed atomic force microscope. Rev Sci Instrum. 2018 Aug;89(8):083704. doi: 10.1063/1.5038095. PMID: 30184715.
Copy
Download .nbib
