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Lumbroso OS, Simine L, Nitzan A, et al. Electronic noise due to temperature differences in atomic-scale junctions. Nature. 2018;562(7726):240-244doi: 10.1038/s41586-018-0592-2.
Lumbroso, O. S., Simine, L., Nitzan, A., Segal, D., & Tal, O. (2018). Electronic noise due to temperature differences in atomic-scale junctions. Nature, 562(7726), 240-244. https://doi.org/10.1038/s41586-018-0592-2
Lumbroso, Ofir Shein, et al. "Electronic noise due to temperature differences in atomic-scale junctions." Nature vol. 562,7726 (2018): 240-244. doi: https://doi.org/10.1038/s41586-018-0592-2
Lumbroso OS, Simine L, Nitzan A, Segal D, Tal O. Electronic noise due to temperature differences in atomic-scale junctions. Nature. 2018 Oct;562(7726):240-244. doi: 10.1038/s41586-018-0592-2. Epub 2018 Oct 10. PMID: 30305745.
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Nature. 2018 Oct;562(7726):240-244. doi: 10.1038/s41586-018-0592-2. Epub 2018 Oct 10.

Electronic noise due to temperature differences in atomic-scale junctions.

Nature

Ofir Shein Lumbroso, Lena Simine, Abraham Nitzan, Dvira Segal, Oren Tal

Affiliations

  1. Department of Chemical and Biological Physics, Weizmann Institute of Science, Rehovot, Israel.
  2. Department of Chemistry, University of Toronto, Toronto, Ontario, Canada.
  3. Department of Chemistry, Rice University, Houston, TX, USA.
  4. Department of Chemistry, University of Pennsylvania, Philadelphia, PA, USA.
  5. School of Chemistry, Tel Aviv University, Tel Aviv, Israel.
  6. Department of Chemical and Biological Physics, Weizmann Institute of Science, Rehovot, Israel. [email protected].

PMID: 30305745 DOI: 10.1038/s41586-018-0592-2

Abstract

Since the discovery a century ago

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