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Zielinski A, Cieslik M, Sobaszek M, et al. Multifrequency nanoscale impedance microscopy (m-NIM): A novel approach towards detection of selective and subtle modifications on the surface of polycrystalline boron-doped diamond electrodes. Ultramicroscopy. 2019;199:34-45doi: 10.1016/j.ultramic.2019.01.004.
Zielinski, A., Cieslik, M., Sobaszek, M., Bogdanowicz, R., Darowicki, K., & Ryl, J. (2019). Multifrequency nanoscale impedance microscopy (m-NIM): A novel approach towards detection of selective and subtle modifications on the surface of polycrystalline boron-doped diamond electrodes. Ultramicroscopy, 19934-45. https://doi.org/10.1016/j.ultramic.2019.01.004
Zielinski, Artur, et al. "Multifrequency nanoscale impedance microscopy (m-NIM): A novel approach towards detection of selective and subtle modifications on the surface of polycrystalline boron-doped diamond electrodes." Ultramicroscopy vol. 199 (2019): 34-45. doi: https://doi.org/10.1016/j.ultramic.2019.01.004
Zielinski A, Cieslik M, Sobaszek M, Bogdanowicz R, Darowicki K, Ryl J. Multifrequency nanoscale impedance microscopy (m-NIM): A novel approach towards detection of selective and subtle modifications on the surface of polycrystalline boron-doped diamond electrodes. Ultramicroscopy. 2019 Apr;199:34-45. doi: 10.1016/j.ultramic.2019.01.004. Epub 2019 Feb 08. PMID: 30772716.
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Ultramicroscopy. 2019 Apr;199:34-45. doi: 10.1016/j.ultramic.2019.01.004. Epub 2019 Feb 08.

Multifrequency nanoscale impedance microscopy (m-NIM): A novel approach towards detection of selective and subtle modifications on the surface of polycrystalline boron-doped diamond electrodes.

Ultramicroscopy

Artur Zielinski, Mateusz Cieslik, Michal Sobaszek, Robert Bogdanowicz, Kazimierz Darowicki, Jacek Ryl

Affiliations

  1. Department of Electrochemistry, Corrosion and Materials Engineering, Faculty of Chemistry, Gdansk University of Technology, Narutowicza 11/12, 80-233 Gdansk, Poland.
  2. Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunication and Informatics, Gdansk University of Technology, Narutowicza 11/12, 80-233 Gdansk, Poland.
  3. Department of Electrochemistry, Corrosion and Materials Engineering, Faculty of Chemistry, Gdansk University of Technology, Narutowicza 11/12, 80-233 Gdansk, Poland. Electronic address: [email protected].

PMID: 30772716 DOI: 10.1016/j.ultramic.2019.01.004

Abstract

In this paper, we describe the modification of Nanoscale Impedance Microscopy (NIM), namely, a combination of contact-mode atomic force microscopy with local impedance measurements. The postulated approach is based on the application of multifrequency voltage perturbation instead of standard frequency-by-frequency analysis, which among others offers more time-efficient and accurate determination of the resultant impedance spectra with high spatial resolution. Based on the impedance spectra analysis with an appropriate electric equivalent circuit, it was possible to map surface resistance and contact capacitance. Polycrystalline heavy boron-doped diamond (BDD) electrodes were the research object. Recent studies have shown that the exposure of such electrodes to oxidizing environment may result in the modification of termination type, and thus it is a key factor in describing the electric and electrochemical properties of BDD. We have successfully applied multifrequency NIM, which allowed us to prove that the modification of termination type is selective and occurs with different propensity on the grains having specific crystallographic orientation. Furthermore, our approach enabled the detection of even subtle submicroscopic surface heterogeneities, created as a result of various oxidation treatments and to distinguish them from the surface heterogeneity related to the local distribution of boron at the grain boundaries.

Copyright © 2019 Elsevier B.V. All rights reserved.

Keywords: Boron-doped diamond; Electrode termination; Heterogeneity; Multifrequency voltage perturbation; Nanoscale impedance microscopy

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