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Spampinato V, Dialameh M, Franquet A, et al. A Correlative ToF-SIMS/SPM Methodology for Probing 3D Devices. Anal Chem. 2020;92(16):11413-11419doi: 10.1021/acs.analchem.0c02406.
Spampinato, V., Dialameh, M., Franquet, A., Fleischmann, C., Conard, T., van der Heide, P., & Vandervorst, W. (2020). A Correlative ToF-SIMS/SPM Methodology for Probing 3D Devices. Analytical chemistry, 92(16), 11413-11419. https://doi.org/10.1021/acs.analchem.0c02406
Spampinato, Valentina, et al. "A Correlative ToF-SIMS/SPM Methodology for Probing 3D Devices." Analytical chemistry vol. 92,16 (2020): 11413-11419. doi: https://doi.org/10.1021/acs.analchem.0c02406
Spampinato V, Dialameh M, Franquet A, Fleischmann C, Conard T, van der Heide P, Vandervorst W. A Correlative ToF-SIMS/SPM Methodology for Probing 3D Devices. Anal Chem. 2020 Aug 18;92(16):11413-11419. doi: 10.1021/acs.analchem.0c02406. Epub 2020 Aug 06. PMID: 32664722.
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