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Janz S, Cheriton R, Xu DX, et al. Photonic temperature and wavelength metrology by spectral pattern recognition. Opt Express. 2020;28(12):17409-17423doi: 10.1364/OE.394642.
Janz, S., Cheriton, R., Xu, D. X., Densmore, A., Dedyulin, S., Todd, A., Schmid, J. H., Cheben, P., Vachon, M., Dezfouli, M. K., & Melati, D. (2020). Photonic temperature and wavelength metrology by spectral pattern recognition. Optics express, 28(12), 17409-17423. https://doi.org/10.1364/OE.394642
Janz, Siegfried, et al. "Photonic temperature and wavelength metrology by spectral pattern recognition." Optics express vol. 28,12 (2020): 17409-17423. doi: https://doi.org/10.1364/OE.394642
Janz S, Cheriton R, Xu DX, Densmore A, Dedyulin S, Todd A, Schmid JH, Cheben P, Vachon M, Dezfouli MK, Melati D. Photonic temperature and wavelength metrology by spectral pattern recognition. Opt Express. 2020 Jun 08;28(12):17409-17423. doi: 10.1364/OE.394642. PMID: 32679949.
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